- Using a test system’s BIT and test & support information “better” to reduce life cycle support costs
- Using already available information from an operational, test and logistic system, structuring it in a standard and widely re-useable format to provide an open architecture to support diagnostic test and repair across all support levels.
- Improving Diagnostic and testability models based on actual perfromance
Some Effects and Implications
- Providing support and gaining useful information from multiple test stations (where every service may have a different ATE). – by defining a open architecture allowing standard information interchange and implemented services for heterogeneous systems
- Providing timely smart diagnostics back into ATE systems in-service, including those at remote locations – by providing a standalone diagnostic aid that can augment existing ATS fielded equipment
- For existing and deployed systems Smart Diagnostics can be introduced at the current test and repair facility and progressively improve performance going forward over time.
- Open Systems Architecture and Standards compliant data needed, to facilitate communication
- Generate Initial Model from historical data and test results